Testing method of array configuration for multiple...

Details Testing method of array configuration for multiple... Testing method of array configuration for multiple...

2006-01-10

2006-01-10

Huynh, Kim (Department: 2182)

Electrical computers and digital data processing systems: input/

Input/output data processing

Peripheral configuration

C710S074000, C710S008000, C711S114000, C714S770000, C714S006130, C714S006130

Reexamination Certificate

active

06985971

ABSTRACT:
An array configuration testing method is proposed for multiple disk-array system containing at least one disk array. The method comprises steps of: reading array configuration; acquiring a quantity of disk drives in the array; reading the serial check sum of all disk drives in the array; and comparing the quantity of disk drives in the array and another quantity of disk drives deduced from the serial check sum of all disk drives in the array. The method further comprises steps of: acquiring the disk sequence/function of the array in the array configuration; comparing the disk sequence/function with another disk sequence/function deduced from the serial check sum of each disk drive in one array. The method cross-examines the serial check sum of each disk drive in the same array and the quantity of disk drives in the array as well as disk sequence/function record in order to check data integrity in the array configuration.

REFERENCES:
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patent: 5950230 (1999-09-01), Islam et al.
patent: 6327672 (2001-12-01), Wilner
patent: 6742081 (2004-05-01), Talagala et al.
patent: 6799284 (2004-09-01), Patel et al.

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