Testing head contact probe with an eccentric contact tip

Details Testing head contact probe with an eccentric contact tip Testing head contact probe with an eccentric contact tip

2007-06-05

2007-06-05

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010

Reexamination Certificate

active

11090970

ABSTRACT:
A contact probe for a testing head effective to test a plurality of semiconductor-integrated electronic devices comprises a rod-like probe body having a cross section of prefixed contour and provided in correspondence with at least one end with an eccentric contact tip. The contact tip is positioned within the contour of the cross section of the probe body.

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patent: 38 18728 (1989-12-01), None
patent: 1243931 (2004-07-01), None

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