Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2008-07-11
2010-10-26
Nguyen, Vinh P (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S1540PB
Reexamination Certificate
active
07821286
ABSTRACT:
A testing device for performing a high-voltage test on a liquid crystal display is provided. The testing device includes a voltage converting unit, an input connector, and a power supplier. The voltage converting unit includes a plurality of resistors between an output terminal and a ground terminal. The input connector includes a terminal connected to one node of the plurality of resistors. The power supplier includes a switching unit to output a ground voltage to the terminal when power is applied from an external power source.
REFERENCES:
patent: 2007/0200589 (2007-08-01), Jeong et al.
patent: 2008/0150856 (2008-06-01), Nam
Hong Ki-hyun
Kang Nam-soo
Lee Ki-young
F. Chau & Associates LLC
Nguyen Vinh P
Samsung Electronics Co,. Ltd.
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