Testing circuits on substrate

Details Testing circuits on substrate Testing circuits on substrate

2006-07-24

2008-11-18

Karlsen, Ernest F (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S765010

Reexamination Certificate

active

07453260

ABSTRACT:
The invention provides a method of testing a circuit on a substrate. Generally speaking, a substrate is located in a transfer chuck, a surface of a test chuck is moved into contact with a substrate, the substrate is secured to the test chuck, the test chuck is moved relative to the transfer chuck so that the substrate moves off the transfer chuck, terminals on the substrate are moved into contact with contacts to electrically connect the circuit through the terminals and the contacts to an electric tester, signals are relayed through the terminal and the contacts between the electric tester and the circuit, the terminals are disengaged from the contacts, and the substrate is removed from the test chuck.

REFERENCES:
patent: 3710251 (1973-01-01), Hagge et al.
patent: 3949295 (1976-04-01), Moorshead
patent: 4460868 (1984-07-01), Schmitt et al.
patent: 5012187 (1991-04-01), Littlebury
patent: 5077523 (1991-12-01), Blanz
patent: 5123850 (1992-06-01), Elder et al.
patent: 5278494 (1994-01-01), Obigane
patent: 5345170 (1994-09-01), Schwindt et al.
patent: 5410259 (1995-04-01), Fujihara et al.
patent: 5444386 (1995-08-01), Mizumura
patent: 5479108 (1995-12-01), Cheng
patent: 5621313 (1997-04-01), Tsuta
patent: 5644245 (1997-07-01), Saitoh et al.
patent: 5667077 (1997-09-01), Goins, III
patent: 5670888 (1997-09-01), Cheng
patent: 5701666 (1997-12-01), DeHaven et al.
patent: 5742173 (1998-04-01), Nakagomi et al.
patent: 5772387 (1998-06-01), Nakamura et al.
patent: 5907246 (1999-05-01), Abraham et al.
patent: 6021380 (2000-02-01), Fredriksen et al.
patent: 6074158 (2000-06-01), Yutaka et al.
patent: 6111421 (2000-08-01), Takahashi et al.
patent: 6124725 (2000-09-01), Sato
patent: 6137303 (2000-10-01), Deckert et al.
patent: 6164894 (2000-12-01), Cheng
patent: 6268740 (2001-07-01), Iida
patent: 6297656 (2001-10-01), Kobayashi et al.
patent: 6509750 (2003-01-01), Talbot et al.
patent: 6771060 (2004-08-01), Boyle et al.
patent: 6781394 (2004-08-01), Boyle et al.
patent: 6861859 (2005-03-01), Boyle et al.
patent: 7002337 (2006-02-01), Boyle et al.
patent: 0 837 333 (1998-04-01), None
patent: 0 940 683 (1999-09-01), None
PCT International Search Report for PCT Application No. PCT/US02/32360, mailed Jan. 29, 2003, 7 pages.
PCT International Search Report for PCT Application No. PCT/US02/32357, mailed Dec. 5, 2003, 6 pages.
PCT International Search Report for PCT Application No. PCT/US02/32358, mailed Aug. 13, 2003, 6 pages.
PCT Written Opinion for PCT Application No. PCT/US02/32357, mailed Jan. 4, 2005, 8 pages.
PCT International Preliminary Examination Report for PCT Application No. PCT/US02/32357, mailed Apr. 4, 2005, 8 pages.

Affiliated with

Also associated with

Rating

Testing circuits on substrate does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Testing circuits on substrate, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing circuits on substrate will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4032749