Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-10-09
2007-10-09
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
11302741
ABSTRACT:
A testing assembly for an electrical test of an electronic package is provided. The testing assembly includes a testing circuit board and a testing socket mounted thereon. The testing socket includes an insulating body and a plurality of pins. The insulating body has a holding surface for supporting a contact surface of the electronic package, and at least one low-dielectric constant region located between two neighboring pins, and the dielectric constant of the low-electric constant region is lower than other regions of the insulating body. In addition, the pins passing through the insulating body are configured as the electric channels between a plurality of contacts on the contact surface and a plurality of testing pads on a conductive layer on a surface of the testing circuit board. Furthermore, the pins include a signal pin, and one end of the signal pin is electrically coupled to the signal testing pad.
REFERENCES:
patent: 5600257 (1997-02-01), Leas et al.
patent: 6400169 (2002-06-01), Hembree
patent: 6462573 (2002-10-01), McAllister et al.
patent: 2004/0046581 (2004-03-01), Maekawa et al.
Hsu Hsing-Chou
Lee Sheng-Yuan
Wu Hsin-Kuan
Hollington Jermele
J.C. Patents
VIA Technologies Inc.
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