Testing apparatus for high frequency integrated circuit chip

Details Testing apparatus for high frequency integrated circuit chip Testing apparatus for high frequency integrated circuit chip

1989-01-27

1993-03-30

Baker, Stephen M.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

333 33, 333247, 333254, G01R 104, G01R 3128, G01R 3102

Patent

active

051987546

ABSTRACT:
A testing apparatus for a high-frequency integrated circuit chip for transporting the high-frequency input/output signals of this circuit by means of high-frequency lines of adapted characteristics impedance to measuring apparatus, is characterized in that it comprises:

REFERENCES:
patent: 3775644 (1973-11-01), Cotner et al.
patent: 4365195 (1982-12-01), Stegens
patent: 4535307 (1985-08-01), Tsukii
patent: 4672312 (1987-06-01), Takamine et al.

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