Testing apparatus for exactly discriminating defective product f

Details Testing apparatus for exactly discriminating defective product f Testing apparatus for exactly discriminating defective product f

1992-07-13

1995-02-21

Voeltz, Emanuel T.

Excavating

371 681, 371 36, 371 221, G06F 1116

Patent

active

053922980

ABSTRACT:
First random test patterns and a second random test pattern having a "don't care" bit pattern are sequentially supplied to a suspect logic gate as well as to two known good logic gates, the second random test pattern is discriminated when the two known good logic gates produce different output signals due to the "don't care" bit pattern, and a comparator can compare the output signal of the suspect logic gate with the output signal of either known good logic gate only when the first random test patterns are distributed thereto, thereby preventing an analyst from mis-judge on the basis of inconsistency due to the second random test pattern.

REFERENCES:
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patent: 4843608 (1989-06-01), Fu et al.
patent: 4924467 (1990-05-01), Criswell
patent: 4942576 (1990-07-01), Busack et al.
patent: 4943969 (1990-07-01), Criswell
patent: 5228042 (1993-07-01), Gauthier et al.

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