Testing an integrated circuit having configurable...

Details Testing an integrated circuit having configurable... Testing an integrated circuit having configurable...

2008-01-28

2011-11-22

Ellis, Kevin L (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Transmission facility testing

C714S700000, C714S725000

Reexamination Certificate

active

08065570

ABSTRACT:
Testing an integrated circuit (IC) having numerous terminals coupled to numerous digitally controlled impedance (DCI) modules, where the numerous DCI modules control configurable impedances of the numerous terminals. The IC further includes a control circuit having outputs coupled to enable inputs of the numerous DCI modules, where operating the IC in a test mode configures the control circuit to selectively couple a control signal to the enable terminals of the numerous DCI modules. One DCI module of the numerous DCI modules can be enabled at a time facilitating testing of the configurable impedances of the I/O terminals.

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