Tester for a semiconductor device

Details Tester for a semiconductor device Tester for a semiconductor device

2006-12-05

2006-12-05

JeanPierre, Peguy (Department: 2819)

Coded data generation or conversion

Converter calibration or testing

C702S118000

Reexamination Certificate

active

07145489

ABSTRACT:
A tester including a first module for testing a digital-to-analog conversion and a second module for testing an analog-to-digital conversion. The tester may include a controller for controlling operation of the first and second modules. The tester does not require a system bus, and modules may be swapped, added to the tester and/or removed from the tester based on application specific requirements.

REFERENCES:
patent: 6449741 (2002-09-01), Organ et al.
patent: 6462532 (2002-10-01), Smith
patent: 6557131 (2003-04-01), Arabi
patent: 6690189 (2004-02-01), Mori et al.
patent: 6889156 (2005-05-01), Pillai
patent: 2003/0154047 (2003-08-01), Chun et al.
patent: 2005/0077905 (2005-04-01), Sasaki
patent: 2002-0060893 (2002-07-01), None
patent: 2003-0067890 (2003-08-01), None

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