4. Coded data generation or conversion
  5. Converter calibration or testing

Byoung-Ok Chun

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Test apparatus for mixed-signal semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Tester for a semiconductor device

Coded data generation or conversion – Converter calibration or testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3008424

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