Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2006-03-09
2008-11-25
Iqbal, Nadeem (Department: 2114)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
Reexamination Certificate
active
07457987
ABSTRACT:
The present invention provides a test vector manager for use with a unit under test (UUT). In one embodiment, the test vector manager includes a gateway device, coupled to the UUT, configured to provide a testing pathway for the UUT to coordinate test requests and responses for a backplane multi-drop test bus. The test vector manager also includes a test memory, coupled to the gateway device, configured to retrieve version-specific test vectors, which are resident on the UUT and correspond to the test requests. The test vector manager further includes a chain configuration logic unit, coupled to the test memory, configured to return the version-specific test vectors to the backplane multi-drop test bus employing the testing pathway. Alternatively, the test vector manager is further configured to connect the backplane multi-drop test bus to local UUT test bus and scan chain interfaces for tests using the version-specific test vectors.
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Franco Antonio L.
Miranda Jose M.
Peterson Bryan E.
Van Treuren Bradford G.
Iqbal Nadeem
Lucent Technologies - Inc.
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