Test systems for low-temperature environmental testing of...

Details Test systems for low-temperature environmental testing of... Test systems for low-temperature environmental testing of...

2005-01-11

2005-01-11

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S760020

Reexamination Certificate

active

06842030

ABSTRACT:
A test system for an integrated circuit chip, protects a circuit board from frost during low temperature testing. The test system comprises sealing means capable of removably attaching to a second surface of the test circuit board and for sealing a portion of the second surface to isolate the portion of the second surface of the test circuit board from ambient air. In this manner, the sealing unit prevents generation of frost at the solder junction portion of the test circuit, which would otherwise lead to leakage failures during test.

REFERENCES:
patent: 5880592 (1999-03-01), Sharpes et al.
patent: 6114868 (2000-09-01), Nevill
patent: 6313653 (2001-11-01), Takahashi et al.
patent: 06-118136 (1994-04-01), None
patent: 07-209373 (1995-08-01), None
patent: 00-035459 (2000-02-01), None
patent: 2000-035459 (2000-02-01), None

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