Test system of semiconductor device having a handler remote...

Details Test system of semiconductor device having a handler remote... Test system of semiconductor device having a handler remote...

2007-06-12

2007-06-12

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

Reexamination Certificate

active

11252448

ABSTRACT:
A test system of a semiconductor device for a handler remote control is provided. The system includes: a tester for testing the semiconductor device; a handler connected to the tester through a GPIB (General Purpose Instruction Bus) communication cable; a tester server connected to the tester to download a test program, handler remote control program and a handler state check program to the tester; and communication data transmitted and received through the GPIB communication cable between the tester and the handler, wherein the communication data has basic communication data for an electrical test of the semiconductor device, communication data for the handler remote control, and communication data for a handler state check.

REFERENCES:
patent: 6225798 (2001-05-01), Onishi et al.
patent: 6-230080 (1994-08-01), None
patent: 11-344528 (1999-12-01), None
patent: 2001-0024015 (2001-03-01), None
English translation of Office Action received from Korean Intellectual Property Office dated Apr. 7, 2006.

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