Test system for variable selection of IC devices for testing

Details Test system for variable selection of IC devices for testing Test system for variable selection of IC devices for testing

1997-11-10

2000-05-02

Ballato, Jossie

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324760, G01R 3100

Patent

active

060576987

ABSTRACT:
A test system for detecting integrated circuit (IC) devices having a short life time. The test system thermally, electrically and functionally tests the IC devices. The test system includes a selection signal generator with a memory device for writing external data into memory cells indicated by address signals and for reading the written external data as device selection signals. A counter sequentially increases the address signals entering into the memory device. The device selection signal patterns can be adjusted according to standard memory test patterns or user defined test patterns.

REFERENCES:
patent: 4922184 (1990-05-01), Rosenstein et al.
patent: 5473259 (1995-12-01), Takeda
patent: 5880592 (1999-03-01), Sharpes et al.

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