Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
1999-09-10
2008-03-25
Chu, Gabriel (Department: 2114)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C714S724000, C702S118000, C206S706000
Reexamination Certificate
active
07350108
ABSTRACT:
A test board includes a plurality of sockets for connection to a plurality of integrated circuit chips to be tested. A test control device on the board turns on at least one test engine for testing the plurality of chips simultaneously. A checking circuit verifies the functionality of each chip by comparing outputs of chips with each other or with a golden chip. Failing chips are disconnected from further testing and passing or failing chips are recorded.
REFERENCES:
patent: 3651315 (1972-03-01), Collins
patent: 4026412 (1977-05-01), Henson
patent: 4122995 (1978-10-01), Franke
patent: 4291404 (1981-09-01), Steiner
patent: 4329642 (1982-05-01), Luthi et al.
patent: 4483441 (1984-11-01), Akizawa et al.
patent: 4559626 (1985-12-01), Brown
patent: 4593820 (1986-06-01), Antonie et al.
patent: 4639664 (1987-01-01), Chiu et al.
patent: 4768195 (1988-08-01), Stoner et al.
patent: 4773028 (1988-09-01), Tallman
patent: 4845843 (1989-07-01), Babcock
patent: 4918928 (1990-04-01), Morioka et al.
patent: 5151650 (1992-09-01), Frisbie et al.
patent: 5180974 (1993-01-01), Mitchell et al.
patent: 5227614 (1993-07-01), Danielson et al.
patent: 5243274 (1993-09-01), Kelsey et al.
patent: 5339262 (1994-08-01), Rostoker et al.
patent: 5341314 (1994-08-01), Bencivenga et al.
patent: 5566186 (1996-10-01), Paterson et al.
patent: 5570270 (1996-10-01), Naedel et al.
patent: 5629876 (1997-05-01), Huang et al.
patent: 5640337 (1997-06-01), Huang et al.
patent: 5642363 (1997-06-01), Smith
patent: 5710934 (1998-01-01), Bona et al.
patent: 6031386 (2000-02-01), Cole et al.
patent: 6037796 (2000-03-01), Graef et al.
patent: 6055653 (2000-04-01), LeBlanc et al.
patent: 6112163 (2000-08-01), Oowaki et al.
patent: 6119225 (2000-09-01), Kim
patent: 6163145 (2000-12-01), Yamada et al.
patent: 6195616 (2001-02-01), Reed et al.
patent: 6198273 (2001-03-01), Onishi et al.
patent: 6353563 (2002-03-01), Hii et al.
patent: 6452411 (2002-09-01), Miller et al.
patent: 6480978 (2002-11-01), Roy et al.
patent: 6499121 (2002-12-01), Roy et al.
Supreme Court of the United States, “KSR Internationalv.Teleflex Inc. et al.”, decided Apr. 20, 2007.
Dean Alvar A.
Ventrone Sebastian T.
Chu Gabriel
Gibb & Rahman, LLC
International Business Machines - Corporation
Kotulak, Esq. Richard M.
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