Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-01-21
2010-02-09
Karlsen, Ernest F (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S755090
Reexamination Certificate
active
07659738
ABSTRACT:
A test socket includes a socket body in which a semiconductor package is located, a socket head combined with the socket body, a Peltier element in the socket head, and power terminals connected to the Peltier element. A test equipment includes the test socket and a method of testing the semiconductor package uses the test socket.
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patent: 02-001577 (1990-01-01), None
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patent: 200334395 (2003-11-01), None
F. Chau & Associates LLC
Karlsen Ernest F
Samsung Electronics Co,. Ltd.
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