Test sockets having peltier elements, test equipment...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Details

C324S755090

Reexamination Certificate

active

07659738

ABSTRACT:
A test socket includes a socket body in which a semiconductor package is located, a socket head combined with the socket body, a Peltier element in the socket head, and power terminals connected to the Peltier element. A test equipment includes the test socket and a method of testing the semiconductor package uses the test socket.

REFERENCES:
patent: 4839587 (1989-06-01), Flatley et al.
patent: 5006796 (1991-04-01), Burton et al.
patent: 5164661 (1992-11-01), Jones
patent: 6181145 (2001-01-01), Tomita et al.
patent: 6919734 (2005-07-01), Saito et al.
patent: 7495458 (2009-02-01), McClanahan et al.
patent: 02-001577 (1990-01-01), None
patent: 1020000049746 (2000-08-01), None
patent: 200334395 (2003-11-01), None

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