Test set for testing a device and methods for use therewith

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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C714S025000

Reexamination Certificate

active

11284655

ABSTRACT:
A test set for testing a device includes a protocol encoder for formatting a plurality of test data in accordance with a channel protocol to create formatted data. A channel encoder encodes the formatted data in accordance with at least one analog channel parameter and at least one analog perturbation parameter to form a link signal. A first link interface produces a channel signal that is coupled to the device. A second link interface generates a received signal that is based on the channel signal.

REFERENCES:
patent: 2006/0156198 (2006-07-01), Boyce et al.

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