Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-06-12
2009-08-25
Dunn, Drew A (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C324S765010
Reexamination Certificate
active
07580807
ABSTRACT:
Disclosed herein is a massive multi-site (MMS) testing architecture. The MMS architecture includes a MMS interface on each of a plurality of devices under test. The MMS interface includes a test protocol manager that may receive test stimulus and send the test stimulus to cores of the device under test. The test protocol manager may receive test responses from cores of the device under test and generate test comparisons based on comparisons between the test responses and expected responses. The test protocol manager may store the test comparisons on the device under test and communicate the stored test comparisons to automated test equipment (ATE) upon being queried by the ATE. The device under test may send the test comparisons to the ATE over a low-bandwidth communication.
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Bullock Matthew Craig
Paglieri Alessandro
Saxena Jayashree
Brady III Wade J.
Dunn Drew A
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
Tung Yingsheng
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