Test fixture for semiconductor package and test method of...

Details Test fixture for semiconductor package and test method of... Test fixture for semiconductor package and test method of...

2005-02-22

2005-02-22

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

06859056

ABSTRACT:
A test fixture for semiconductor packages and a test method of using the test fixture are proposed. The test fixture is composed of a circuit board, an interposer and a covering member. The circuit board is used to accommodate semiconductor packages and electrically connect the semiconductor packages to a test device. The interposer is mounted on the circuit board, and formed with through holes for receiving the semiconductor packages therein. The covering member is attached onto the interposer, and provided with elastic mechanisms for holding the semiconductor packages in position. By using the test fixture, semiconductor packages can be firmly coupled to the test device where functional tests are performed.

REFERENCES:
patent: 5702255 (1997-12-01), Murphy et al.
patent: 5932891 (1999-08-01), Higashi et al.
patent: 5955888 (1999-09-01), Frederickson et al.
patent: 6018249 (2000-01-01), Akram et al.
patent: 6193524 (2001-02-01), Chang
patent: 6218849 (2001-04-01), Kiyokawa
patent: 6229320 (2001-05-01), Haseyama et al.
patent: 6292003 (2001-09-01), Fredrickson et al.
patent: 6344684 (2002-02-01), Hussain et al.
patent: 6400169 (2002-06-01), Hembree
patent: 6503089 (2003-01-01), Saijo et al.

Affiliated with

Also associated with

Rating

Test fixture for semiconductor package and test method of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test fixture for semiconductor package and test method of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test fixture for semiconductor package and test method of... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3485054