Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2005-04-07
2008-11-11
Chu, Gabriel L (Department: 2114)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C714S046000
Reexamination Certificate
active
07451358
ABSTRACT:
A test executive sequence may be created by including a plurality of test executive steps in the test executive sequence in response to user input to a sequence editor. At least a subset of the test executive steps in the test executive sequence may be configured to call user-supplied code modules. In one embodiment, one or more expressions may be configured for one or more steps in the test executive sequence, where the one or more expressions evaluate to result values to be logged when the step is executed during execution of the test executive sequence. In another embodiment, one or more parameters of one or more user-supplied code modules called by steps in the test executive sequence may be configured to be logged when the test executive sequence is executed.
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Prior Art Statement; 1 page.
Grey James A.
Perez Hjalmar
Burgess Jason L.
Chu Gabriel L
Hood Jeffrey C.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
National Instruments Corporation
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