Optics: measuring and testing – Angle measuring or angular axial alignment – Apex of angle at observing or detecting station
Reexamination Certificate
2007-12-04
2007-12-04
Punnoose, Roy M. (Department: 2886)
Optics: measuring and testing
Angle measuring or angular axial alignment
Apex of angle at observing or detecting station
C356S138000
Reexamination Certificate
active
10942554
ABSTRACT:
A novel test device and method for calibrating the alignment of a laser beam emitted from a laser metrology tool with respect to a target area on a substrate. The test device includes a laser-sensitive material having a calibration pattern that includes a target point. When the tool is properly adjusted, the laser beam strikes the target point and is released to production. If the laser beam misses the target point, the tool is re-adjusted and re-tested until the laser beam strikes the target point.
REFERENCES:
patent: 3633285 (1972-01-01), Sensney
patent: 3778169 (1973-12-01), Adams
patent: 3801205 (1974-04-01), Eggenschwyler
patent: 4330212 (1982-05-01), Miller
patent: 6473980 (2002-11-01), Ripingill et al.
patent: 6807740 (2004-10-01), Reed et al.
patent: 2002/0009694 (2002-01-01), Rosa
patent: 2002/0064761 (2002-05-01), Ripingill et al.
patent: 2006/0042106 (2006-03-01), Smith et al.
Chang Shih-Tzung
Chen Kei-Wei
Lin Shih-Ho
Lin Yu-Ku
Su Ching-Hwan
Punnoose Roy M.
Taiwan Semiconductor Manufacturing Co. Ltd.
Tung & Associates
LandOfFree
Test device and method for laser alignment calibration does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Test device and method for laser alignment calibration, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test device and method for laser alignment calibration will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3825913