Test circuits and methods for built-in testing integrated device

Details Test circuits and methods for built-in testing integrated device Test circuits and methods for built-in testing integrated device

1996-09-23

2000-02-01

Canney, Vincent P.

Excavating

G06F 1160

Patent

active

060195029

ABSTRACT:
An test circuit and method for testing an integrated device having an embedded function and a built-in test circuit for testing the embedded function. The built-in test circuit provides control signals to the embedded function based upon an internal state of the built-in test circuit. The integrated device is tested by comparing the control signals provided to the embedded function to the desired control signals based upon the internal state of the built-in self test circuit to confirm the proper operation of the built-in self test circuit. The internal state of the built-in test circuit is monitored and the control signals provided to the embedded function are monitored. The monitored signals are compared to an expected signal pattern based upon the monitored internal state of the built-in test circuit. An error signal is generated if the comparison determines that the monitored control signals do not correspond to the expected signal pattern.

REFERENCES:
patent: 5542033 (1996-07-01), Dao-Trong et al.
patent: 5617531 (1997-04-01), Crouch et al.

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