Test circuit, wafer, measuring apparatus, measuring method,...

Details Test circuit, wafer, measuring apparatus, measuring method,... Test circuit, wafer, measuring apparatus, measuring method,...

2011-06-21

2011-06-21

Hollington, Jermele M (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07965097

ABSTRACT:
There is provided a wafer on which a plurality of electronic devices and circuits under test are to be formed, where each circuit under test includes a plurality of transistors under measurement provided in electrically parallel, a selecting section which sequentially selects the respective transistors under measurement, and an output section which sequentially outputs the source voltages of the transistors under measurement sequentially selected by the selecting section.

REFERENCES:
patent: 5265057 (1993-11-01), Furuyama et al.
patent: 7774081 (2010-08-01), Okayasu et al.
patent: 7848828 (2010-12-01), Okayasu et al.
patent: 7863925 (2011-01-01), Sugawa et al.
patent: 2004/0263199 (2004-12-01), Braceras et al.
patent: 2005/0200377 (2005-09-01), Orii et al.
patent: 2008/0224725 (2008-09-01), Sugawa et al.
patent: 2009/0058456 (2009-03-01), Okayasu et al.
patent: 2009/0081819 (2009-03-01), Okayasu et al.

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