Test circuit, wafer, measuring apparatus, and measuring method

Details Test circuit, wafer, measuring apparatus, and measuring method Test circuit, wafer, measuring apparatus, and measuring method

2011-01-04

2011-01-04

Hollington, Jermele M (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07863925

ABSTRACT:
There is provided a wafer on which a plurality of electronic devices and circuits under test are to be formed, where each circuit under test includes a plurality of transistors under measurement provided in electrically parallel, a selecting section which sequentially selects the respective transistors under measurement, and an output section which sequentially outputs the source voltages of the transistors under measurement sequentially selected by the selecting section.

REFERENCES:
patent: 5149993 (1992-09-01), Kikuchi et al.
patent: 5258958 (1993-11-01), Iwahashi et al.
patent: 5774008 (1998-06-01), Shou et al.
patent: 6897674 (2005-05-01), Braceras et al.
patent: 7180320 (2007-02-01), Braceras et al.
patent: 2004/0032278 (2004-02-01), Orii et al.
patent: 2004/0263199 (2004-12-01), Braceras et al.
patent: 2005/0200377 (2005-09-01), Orii et al.
patent: 2008/0238964 (2008-10-01), Umeda
patent: 03-204959 (1991-09-01), None
patent: 10-223707 (1998-08-01), None
patent: 19930007488 (1993-08-01), None
“Office Action of Korean counterpart application”, issued on Aug. 31, 2009, p. 1-p. 7.
“First Office Action of China Counterpart Application”, issued by theSIPO of P.R. China on May 22, 2009.

Affiliated with

Also associated with

Rating

Test circuit, wafer, measuring apparatus, and measuring method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test circuit, wafer, measuring apparatus, and measuring method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test circuit, wafer, measuring apparatus, and measuring method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2622996