Test circuit, selector, and semiconductor integrated circuit

Details Test circuit, selector, and semiconductor integrated circuit Test circuit, selector, and semiconductor integrated circuit

2007-05-03

2009-11-24

Chang, Daniel D (Department: 2819)

Electronic digital logic circuitry

Tri-state

C326S113000, C326S016000, C327S410000

Reexamination Certificate

active

07622953

ABSTRACT:
A test circuit according to the present invention performs a test of a first tri-state device and a second tri-state device having their outputs connected to the same node, and includes: a test output terminal; and a test unit operable to output a first logical value or a second logical value to the test output terminal according to whether the voltage of the node is higher or lower than a threshold value, and the test unit converts the intermediate potential occurring at the node into the first logical value and outputs the first logical value to the test output terminal when the first tri-state device outputs a high level signal to the node and the second tri-state device outputs a low level signal to the node.

REFERENCES:
patent: 5285119 (1994-02-01), Takahashi
patent: 5955912 (1999-09-01), Ko
patent: 6016564 (2000-01-01), Hosokawa
patent: 6232799 (2001-05-01), Allen et al.
patent: 11-052019 (1999-02-01), None
English language Abstract of JP 11-052019.

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