Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1997-04-24
2000-02-22
Snow, Walter E.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324537, G06F 702
Patent
active
060284420
ABSTRACT:
A liquid crystal display is modified to support exhaustive, quantitative testing after assembly while requiring only a limited number of test pads. Multiple data lines are connected to form data line blocks on-board the display but outside the active area of the array for testing purposes. Each data line block is connected to a corresponding test pad via a control switch, the control switches being preferably formed of TFTs and controlled by test gate lines arranged perpendicular to the data lines in matrix form.
REFERENCES:
patent: 5546013 (1996-08-01), Ichioka
Choi Jin-Ho
Lee Gun-Won
Samsung Electronics Co,. Ltd.
Snow Walter E.
LandOfFree
Test circuit for identifying open and short circuit defects in a does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Test circuit for identifying open and short circuit defects in a, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test circuit for identifying open and short circuit defects in a will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-523320