Test circuit for evaluating characteristic of analog signal...

Details Test circuit for evaluating characteristic of analog signal... Test circuit for evaluating characteristic of analog signal...

2006-07-18

2006-07-18

Williams, Howard L. (Department: 2819)

Coded data generation or conversion

Converter calibration or testing

C702S069000

Reexamination Certificate

active

07079060

ABSTRACT:
In a test circuit, a determination circuit conducts a function test to determine whether timing of a slope section of waveform of an analog signal ANS of a measurement target device is within a range of specifications. An ADC performs AD-conversion only when a potential of analog signal ANS is within a range between reference potentials VOL, VOH. An analysis unit analyzes digital data from the ADC, and conducts a sloping waveform test to evaluate a sloping state of the waveform of analog signal ANS. Therefore, the slope section of the waveform of analog signal ANS of the device can be subjected to AD-conversion in a voltage range divided in arbitrary number of sections within a range of arbitrary voltage amplitude without requiring a large-capacity storage circuit. The function test by a determination circuit and the sloping waveform test by the analysis unit can be performed in parallel.

REFERENCES:
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patent: 5352976 (1994-10-01), Walker et al.
patent: 5854598 (1998-12-01), De Vries et al.
patent: 6956422 (2005-10-01), Reilly et al.
patent: 5-014200 (1993-01-01), None
patent: 5-119064 (1993-05-01), None
patent: 2000-292469 (2000-10-01), None

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