Test apparatus having multiple test sites at one handler and...

Details Test apparatus having multiple test sites at one handler and... Test apparatus having multiple test sites at one handler and...

2005-06-07

2005-06-07

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB, C438S017000

Reexamination Certificate

active

06903567

ABSTRACT:
A test apparatus includes one handler connected to a tester and one test board divided into two or more sites or two or more test boards. Since only the sites on the test board (or test boards) need be duplicated, rather than the loading lanes or sorters of the handler, the test apparatus can be conveniently compact. Further, while testing semiconductor devices on one site or one test board, semiconductor devices in another site or on another test board can be sorted according to the test result. This enables the reduction or elimination of tester idle time to optimize the efficiency of the test apparatus.

REFERENCES:
patent: 5390129 (1995-02-01), Rhodes
patent: 5778386 (1998-07-01), Lin et al.
patent: 6043101 (2000-03-01), Stubblefield et al.
patent: 6563070 (2003-05-01), Capser
patent: 6815233 (2004-11-01), Erhardt et al.
patent: 1020010084288 (2001-09-01), None
patent: 1020020013303 (2002-02-01), None
patent: 1020020023600 (2002-03-01), None
patent: 2003-0057209 (2003-07-01), None
English language abstract of Korean Publication No. 1020010084288.
English language abstract of Korean Publication No. 1020020013303.
English language abstract of Korean Publication No. 1020020023600.
English language abstract of Korean Publication No. 2003-0057209.

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