Test apparatus and test method

Details Test apparatus and test method Test apparatus and test method

2008-07-15

2008-07-15

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Including specific communication means

Reexamination Certificate

active

07400998

ABSTRACT:
A test apparatus adapted for testing different electronic devices is provided. The apparatus provides a standard interface for operating with the different electronic devices. The interface provides an optional interface region, an optional test command region, and a selected test command region. The optional interface region is for displaying optional interfaces. The optional test command region is for displaying optional test commands relating to an interface selected in the optional interface region. The selected test command region is for displaying test commands selected from the optional test command region. In response to a selection on the user interface, the apparatus recognizes the interface and the test commands selected, and transmits instruction sets corresponding to the test commands through the interface recognized to the corresponding electronic device, thereby driving the electronic device performing required tests.

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Liau et al., ‘Computational Intelligence-based Testing for Noise and Robustness Analysis’, Jul. 2005, IEEE Publication, pp. 279-284.

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