Test apparatus, adjustment method and recording medium

Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C702S108000, C702S124000, C702S125000, C365S201000, C714S025000, C714S707000, C714S709000, C714S715000, C714S718000, C714S719000, C714S724000, C714S731000, C714S735000, C714S738000, C714S744000

Reexamination Certificate

active

07574633

ABSTRACT:
There is provided a test apparatus that tests a device under test including a plurality of data terminals and a clock output terminal, the test apparatus including a plurality of first variable delay circuits that delays a reference clock, a plurality of timing clock generating sections that outputs a timing clock having a phase obtained by shifting a phase of the delayed reference clock by a designated phase shift amount, a timing comparator that acquires a data signal in accordance with the timing clock, a plurality of second variable delay circuits that delays the timing clock, a plurality of phase comparators that outputs a phase shift amount according to a phase difference between a clock signal and the timing clock, a first adjusting section that adjusts a delay amount of the first variable delay circuit so that the timing comparator acquires a data signal based on the timing clock, and a second adjusting section that adjusts a delay amount of the second variable delay circuit so that the timing comparator acquires the data signal based on the clock signal.

REFERENCES:
patent: 7307895 (2007-12-01), Kuhn et al.
patent: 2001/0052097 (2001-12-01), Miura
patent: 2004/0122620 (2004-06-01), Doi et al.
patent: 2005/0149801 (2005-07-01), Oshima
patent: 2001-201532 (2001-07-01), None
patent: 2002-042498 (2002-02-01), None
patent: 2005-285160 (2005-10-01), None
International Search Report issued in International Application No. PCT/JP2007/063654 mailed on Sep. 18, 2007, 10 pages.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Test apparatus, adjustment method and recording medium does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test apparatus, adjustment method and recording medium, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test apparatus, adjustment method and recording medium will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4090712

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.