Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
Patent
1983-04-15
1984-12-25
Albritton, C. L.
Thermal measuring and testing
Leak or flaw detection
With heating or cooling of specimen for test
374163, 374179, 338 26, 338214, 340596, G01N 2572, F16L 5504
Patent
active
044900538
ABSTRACT:
A temperature threshold detector (10) comprises a first electrical conductor (11) and a second electrical conductor (12), which are separated by a spacing structure (13). The first and second electrical conductors (11 and 12) are made of metals that are dissimilar from each other in terms of oxidation potentials or thermally generated electromotive force. The spacing structure (13) is made of a material whose electrical resistivity is temperature dependent so that, when exposed to a temperature below a predetermined threshold value, the spacing structure (13) provides electrical isolation between the first and second electrical conductors (11 and 12). However, when exposed to a temperature above the predetermined threshold value, the spacing structure (13) enables an electromotive force to develop across the first and second conductors (11 and 12). This electromotive force is indicative of temperature rise above the predetermined threshold.
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Coston Charles J.
Higgins Euel V.
Albritton C. L.
Lockheed Missiles & Space Company Inc.
Morrissey John J.
Sears C. N.
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