Temperature sensor capable of reducing test mode time

Details Temperature sensor capable of reducing test mode time Temperature sensor capable of reducing test mode time

2008-11-18

2011-12-20

Lappas, Jason (Department: 2827)

Static information storage and retrieval

Read/write circuit

Differential sensing

C365S225700, C365S201000

Reexamination Certificate

active

08081531

ABSTRACT:
A temperature sensor includes a temperature sensing unit for producing a sensing level by sensing an internal temperature in a semiconductor memory device, a reference level generating unit for setting up a reference level by selecting one of a plurality of reference voltages, which are set up according to the internal temperature of the semiconductor memory device, in response to a test mode signal and a temperature detecting signal, wherein the reference level generating unit includes fuse, and a comparison unit for comparing the sensing level to the reference level and producing the temperature detecting signal.

REFERENCES:
patent: 6577545 (2003-06-01), Kim et al.
patent: 7410294 (2008-08-01), Shiraki et al.
patent: 7417448 (2008-08-01), Lim et al.
patent: 54-148580 (1979-11-01), None
patent: 2004-85384 (2004-03-01), None
patent: 10-2008-0005096 (2008-01-01), None
patent: 10-0832029 (2008-05-01), None

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