Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2006-09-12
2006-09-12
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C327S513000, C365S189090, C377S025000, C702S104000
Reexamination Certificate
active
07107178
ABSTRACT:
A temperature sensing circuit has numerous trip points in conformity with a temperature change without adding decrease resistance branches, so as to obtain a fine control based on the temperature change. Accordingly, when employed in a semiconductor memory device, the temperature sensing circuit substantially reduces the consumption of refresh electrical power in a stand-by state without decreasing the reliability of the semiconductor memory device.
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Kim Jae-Hoon
Park Jong-Wook
Won Myung-Gyoo
Le John H.
Samsung Electronics Co,. Ltd.
Volentine Francos & Whitt
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