Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Patent
1997-04-15
2000-04-25
Hoff, Marc S.
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
702 99, 374173, 374182, 327512, G01K 300
Patent
active
060554894
ABSTRACT:
An integrated circuit includes: a comparator coupled in a configuration to compare two voltages. One of the two voltages includes a semiconductor junction voltage drop. The other of the two voltages includes a voltage signal, X V.sub.t, where V.sub.t is a thermal voltage and X includes a selected signal value, which modulates the thermal voltage. The configuration includes a feedback path to vary X until X V.sub.t approximately equals the voltage including the semiconductor junction voltage drop.
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U.S. Patent Application No. 08/636,024 filed Apr. 19, 1996; which is a continuation of application No. 08/401,473 filed Mar. 9, 1995 (now abandoned); which is a divisional of application No. 08/124,980 filed Sep. 21, 1993 (now abandoned).
Beatty Timothy S.
Fletcher Thomas D.
McAllister Christopher P.
Bui Bryan
Churilla Paul
Hoff Marc S.
Intel Corporation
Skaist Howard A.
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