4. Data processing: measuring, calibrating, or testing
  5. Measurement system
  6. Temperature measuring system

Christopher P. McAllister

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JTAG boundary scan cell with enhanced testability feature

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Temperature measurement and compensation scheme

Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Patent

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Profile ID: LFUS-PAI-P-1164074

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