Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2007-05-10
2008-11-11
Tran, Andrew Q (Department: 2824)
Static information storage and retrieval
Read/write circuit
Differential sensing
C365S211000, C365S189020, C365S189070, C365S227000, C365S228000, C365S051000, C365S063000
Reexamination Certificate
active
07450456
ABSTRACT:
The temperature for multiple devices of a memory module are determined. In one example a memory module includes a printed circuit board, a plurality of memory chips on the printed circuit board, each chip containing a plurality of memory cells and a thermal sensor, and a multiplexer on the printed circuit board, independent of the memory chips, coupled to each of the thermal sensors. A current source is coupled to the multiplexer to provide a current to each one of the thermal sensors, and a voltage detector is coupled to the multiplexer to detect a voltage from each of the thermal sensors when a current is applied. A temperature circuit is coupled to the voltage detector to determine a temperature for each memory chip based on the detected voltage.
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PCT Search Report , PCT/US2006/012984, Filing date: Mar. 30, 2006, Applicant Intel Corporation.
Halbert John
Isbara Melik
Jain Sandeep
Mishra Animesh
Shi Jun
Blakely , Sokoloff, Taylor & Zafman LLP
Intel Corporation
Tran Andrew Q
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