Techniques for the use of amorphous carbon (APF) for various...

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

Reexamination Certificate

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C438S723000, C438S724000, C216S041000, C216S058000, C216S067000, C216S072000, C216S075000, C216S079000, C216S081000

Reexamination Certificate

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07064078

ABSTRACT:
A method of etching a substrate is provided. The method of etching a substrate includes transferring a pattern into the substrate using a double patterned amorphous carbon layer on the substrate as a hardmask. Optionally, a non-carbon based layer is deposited on the amorphous carbon layer as a capping layer before the pattern is transferred into the substrate.

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