Techniques for obtaining a specified lifetime for a data...

Electrical computers and digital processing systems: memory – Storage accessing and control – Specific memory composition

Reexamination Certificate

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C711S112000, C711S154000, C714S001000, C714S773000

Reexamination Certificate

active

08010738

ABSTRACT:
Described are techniques for processing requests for a device. One embodiment is directed to a method including receiving a first value indicating an expected usage of said device prior to failure of said device, receiving a second value indicated a specified lifetime of said device, said second value being in units of time, determining a target rate of usage for the device in accordance with said first value and said second value, determining a current rate of usage for the device, determining whether the current rate of usage is greater than the target rate of usage; and, if said current rate of usage is greater than the target rate of usage, performing an action to reduce the current rate of usage for the device.

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