Technique for stable processing of thin/fragile substrates

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE29287

Reexamination Certificate

active

11380457

ABSTRACT:
A semiconductor on insulator (SOI) wafer includes a semiconductor substrate having first and second main surfaces opposite to each other. A dielectric layer is disposed on at least a portion of the first main surface of the semiconductor substrate. A device layer has a first main surface and a second main surface. The second main surface of the device layer is disposed on a surface of the dielectric layer opposite to the semiconductor substrate. A plurality of intended die areas are defined on the first main surface of the device layer. The plurality of intended die areas are separated from one another. A plurality of die access trenches are formed in the semiconductor substrate from the second main surface. Each of the plurality of die access trenches are disposed generally beneath at least a respective one of the plurality of intended die areas.

REFERENCES:
patent: 4211582 (1980-07-01), Horng et al.
patent: 4238278 (1980-12-01), Antipov
patent: 4491486 (1985-01-01), Iwai
patent: 4866004 (1989-09-01), Fukushima
patent: 4895810 (1990-01-01), Meyer et al.
patent: 4994406 (1991-02-01), Vasquez et al.
patent: 5019522 (1991-05-01), Meyer et al.
patent: 5366914 (1994-11-01), Takahashi et al.
patent: 5432113 (1995-07-01), Tani
patent: 5479048 (1995-12-01), Yallup et al.
patent: 5585285 (1996-12-01), Tang
patent: 5902127 (1999-05-01), Park
patent: 5926713 (1999-07-01), Hause et al.
patent: 6174773 (2001-01-01), Fujishima
patent: 6214698 (2001-04-01), Liaw et al.
patent: 6495421 (2002-12-01), Luo
patent: 6534367 (2003-03-01), Peake et al.
patent: 6613644 (2003-09-01), Lachner
patent: 6762473 (2004-07-01), Goushcha et al.
patent: 6797589 (2004-09-01), Adams et al.
patent: 6940144 (2005-09-01), Nakayama
patent: 7015104 (2006-03-01), Blanchard
patent: 7023069 (2006-04-01), Blanchard
patent: 7041560 (2006-05-01), Hshich
patent: 7052982 (2006-05-01), Hshich et al.
patent: 2004/0157410 (2004-08-01), Yamaguchi
patent: 2005/0176192 (2005-08-01), Hshieh
patent: 2006/0079024 (2006-04-01), Akram
patent: 2007/0166997 (2007-07-01), Knorr
patent: 2007/0262378 (2007-11-01), Wilson et al.
patent: 2005001941 (2005-01-01), None
Dictionary.com www.dictionary.reference.com.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Technique for stable processing of thin/fragile substrates does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Technique for stable processing of thin/fragile substrates, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Technique for stable processing of thin/fragile substrates will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3942499

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.