Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-02-13
2008-11-18
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07454726
ABSTRACT:
A design of an integrated circuit is first verified using directed and/or random test cases. For a cover directive not covered by the directed and/or random test cases, a property is created, where a simulation trace that causes the property to fail covers the cover directive. Thereafter, the property is evaluated, and dependent on the evaluation, the simulation trace is dumped and stored for subsequent exercising of the cover directive.
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Ganesan Harihara
Lam William K.
Wong Yick Kei
Osha • Liang LLP
Siek Vuthe
Sun Microsystems Inc.
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