Technique for forming transistors having raised drain and...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S300000, C438S142000, C438S197000, C438S595000

Reexamination Certificate

active

10862518

ABSTRACT:
The height of epitaxially grown semiconductor regions in extremely scaled semiconductor devices may be adjusted individually for different device regions in that two or more epitaxial growth steps may be carried out, wherein an epitaxial growth mask selectively suppresses the formation of a semiconductor region in a specified device region. In other embodiments, a common epitaxial growth process may be used for two or more different device regions and subsequently a selective oxidation process may be performed on selected device regions so as to precisely reduce the height of the previously epitaxially grown semiconductor regions in the selected areas.

REFERENCES:
patent: 5268324 (1993-12-01), Aitken et al.
patent: 5665616 (1997-09-01), Kimura et al.
patent: 5856225 (1999-01-01), Lee et al.
patent: 5875665 (1999-03-01), Yamamoto et al.
patent: 5970351 (1999-10-01), Takeuchi
patent: 6165826 (2000-12-01), Chau et al.
patent: 6235568 (2001-05-01), Murthy et al.
patent: 6800530 (2004-10-01), Lee et al.
patent: 6906360 (2005-06-01), Chen et al.
patent: 6967382 (2005-11-01), Kim
patent: 7018891 (2006-03-01), Doris et al.
patent: 2002/0005553 (2002-01-01), Ootsuka et al.
patent: 2002/0106855 (2002-08-01), Sato et al.
patent: 2002/0158292 (2002-10-01), Abe et al.
patent: 2003/0052372 (2003-03-01), Ibara et al.
patent: 2003/0164513 (2003-09-01), Ping et al.
patent: 2003/0230811 (2003-12-01), Kim
patent: 2005/0127408 (2005-06-01), Doris et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Technique for forming transistors having raised drain and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Technique for forming transistors having raised drain and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Technique for forming transistors having raised drain and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3894792

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.