Technique for determining performance characteristics of...

Details Technique for determining performance characteristics of... Technique for determining performance characteristics of...

2005-07-19

2005-07-19

McElheny, Jr., Donald E. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S064000, C702S079000, C702S117000, C324S532000

Reexamination Certificate

active

06920402

ABSTRACT:
A technique for determining performance characteristics of electronic devices and systems is disclosed. In one embodiment, the technique is realized by measuring a first response on a first transmission line from a single pulse transmitted on the first transmission line, and then measuring a second response on the first transmission line from a single pulse transmitted on at least one second transmission line, wherein the at least one second transmission line is substantially adjacent to the first transmission line. The worst case bit sequences for transmission on the first transmission line and the at least one second transmission line are then determined based upon the first response, and the second response for determining performance characteristics associated with the first transmission line.

REFERENCES:
patent: 3288929 (1966-11-01), Hutchinson
patent: 3678194 (1972-07-01), Orrell, Jr.
patent: 4590600 (1986-05-01), Beeman et al.
patent: 5110211 (1992-05-01), Niki et al.
patent: 5361398 (1994-11-01), Christian et al.
patent: 5566214 (1996-10-01), Kroeger et al.
patent: 5742798 (1998-04-01), Goldrian
patent: 5982208 (1999-11-01), Kokubo et al.
patent: 6128319 (2000-10-01), Ngai
patent: 6205202 (2001-03-01), Yoshida et al.
patent: 6327542 (2001-12-01), McBride
patent: 6539527 (2003-03-01), Naffziger et al.
patent: 6578180 (2003-06-01), Tanner
patent: 6625239 (2003-09-01), Shiraishi et al.
patent: 6633605 (2003-10-01), Katsman et al.
patent: 262659 (1988-04-01), None
patent: 508459 (1992-10-01), None
patent: 2000-35831 (2000-02-01), None

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