X-ray or gamma ray systems or devices – Accessory – Alignment
Reexamination Certificate
2007-08-17
2009-10-13
Kiknadze, Irakli (Department: 2882)
X-ray or gamma ray systems or devices
Accessory
Alignment
C378S086000
Reexamination Certificate
active
07600916
ABSTRACT:
A method for X-ray analysis of a sample includes directing a beam of X-rays to impinge on a structure in the sample such that the X-rays are scattered from the structure in a pattern of stripes, and receiving the scattered X-rays using an array of detectors. A relative alignment between the sample and the array is adjusted so that the stripes are parallel to the detectors.
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Berman David
Krokhmal Alexander
Peled Asher
Yokhin Boris
Jordan Valley Semiconductors Ltd.
Kiknadze Irakli
Smith , Gambrell & Russell, LLP
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