X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate
2009-07-30
2011-11-08
Kao, Glen (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Absorption
C378S059000
Reexamination Certificate
active
08054939
ABSTRACT:
A method and apparatus for measuring a structure. An x-ray system and the structure are positioned relative to each other. The x-ray system comprises a gas source configured to provide a gas, a laser system configured to emit a laser beam, a steering system, and a detector. The steering system is configured to direct a first portion of the laser beam into the gas such that an electron beam is generated by the laser beam interacting with the gas and is configured to direct a second portion of the laser beam into the electron beam such that a collimated x-ray beam is formed. The detector is configured to detect the collimated x-ray beam. The collimated x-ray beam is emitted with the structure positioned relative to the x-ray system.
REFERENCES:
patent: 2735018 (1956-02-01), McLachlan
patent: 3766387 (1973-10-01), Heffan et al.
patent: 5042055 (1991-08-01), Wirt et al.
patent: 5577091 (1996-11-01), Richardson et al.
patent: 5754621 (1998-05-01), Suzuki et al.
patent: 5870450 (1999-02-01), Khutoryansky et al.
patent: 6229872 (2001-05-01), Amos
patent: 6256372 (2001-07-01), Aufrichtig et al.
patent: 6333966 (2001-12-01), Schoen
patent: 6678350 (2004-01-01), Dolazza et al.
patent: 6873677 (2005-03-01), Kaufman
patent: 7031429 (2006-04-01), Akagi
patent: 7127090 (2006-10-01), Kreang-Arekul et al.
patent: 7187753 (2007-03-01), Freudenberger et al.
patent: 7236564 (2007-06-01), Hopkins et al.
patent: 7280636 (2007-10-01), Morrison et al.
patent: 7310408 (2007-12-01), Filkins et al.
patent: 7321604 (2008-01-01), Umstadter et al.
patent: 7356115 (2008-04-01), Ford et al.
patent: 7412025 (2008-08-01), Bossi et al.
patent: 7522755 (2009-04-01), Li et al.
patent: 2002/0057760 (2002-05-01), Carroll et al.
patent: 2002/0094062 (2002-07-01), Dolazza et al.
patent: 2003/0026469 (2003-02-01), Kreang-Arekul et al.
patent: 2004/0109532 (2004-06-01), Ford et al.
patent: 2004/0208276 (2004-10-01), Kaufman
patent: 2004/0213372 (2004-10-01), Akagi
patent: 2004/0218718 (2004-11-01), Freudenberger et al.
patent: 2004/0240506 (2004-12-01), Sandstrom et al.
patent: 2005/0069086 (2005-03-01), Deych et al.
patent: 2005/0117705 (2005-06-01), Morrison et al.
patent: 2005/0147147 (2005-07-01), Umstadter et al.
patent: 2006/0204076 (2006-09-01), Avinash et al.
patent: 2007/0034805 (2007-02-01), Hopkins et al.
patent: 2010/0072405 (2010-03-01), Yu et al.
patent: 2010/0290587 (2010-11-01), Umstadter et al.
patent: 0802705 (1997-10-01), None
patent: 2002323598 (2002-11-01), None
patent: 2005069451 (2005-07-01), None
patent: 2006104956 (2006-10-01), None
USPTO office action for U.S. Appl. No. 12/154,214 dated Dec. 28, 2009.
USPTO office action for U.S. Appl. No. 12/259,753 dated Feb. 4, 2010.
Dilmanian, “Computed Tomography with Monochromatic Xrays”, American Journal of Physiological Imaging, 1992: 7 (3-4) 175-93.
USPTO final office action for U.S. Appl. No. 12/145,214 dated Mar. 26, 2010.
Coumans, “Duel-energy X-ray Diagnostics,” Philips Tech. Rev. 42, No. 8/9 pp. 274-285, Jun. 24, 1986.
Lehmann et al., “Generalized Image Combination in Dual kVp Digital Radiography,” Med. Phys. 8 (5), Sep./Oct. 1981, pp. 659-666.
Engler et al. , “Review of Duel-Energy Computed Tomography Techniques,” The American Society for Nondestructive Testing, Inc., Materials Evaluation, 48 May 1990, pp. 623-629.
Dobashi et al., “Development of Compact Hard X-ray Source Based on Laser-Electron Collision Using X-Band Linac”, Proceedings of EPAC 2002, Paris France, pp. 677-679, (2002).
Carroll, “Tunable, Monochromatic X-Rays: An Enabling Technology for Molecular/Cellular Imaging and Therapy”, Journal of Cellular Biochemistry, 2003, pp. 90: 502-508.
Schwartz, “Use of Tangential Radiography and Resonance Ultrasonic Techniques to Evaluate Bonding Quality”, pp. 1-7, retrieved Jul. 21, 2009. http://www.ndt.net/article/wcndt2004/pdf/materials—characterization/304—schwartz.pdf.
Tritz et al., “Tangential soft x-ray imaging for shape and current profile measurements”, Review of Scientific Instruments, vol. 74, No. 3, Mar. 2003, pp. 2161-2164.
Rousse et al., “Production of a keV X-Ray Beam from Synchrotron Radiation in Relativistic Laser-Plasma Interaction”, The American Physical Society, vol. 93, No. 13, Sep. 2004, pp. 135005-1 to 135005-4.
Burkle, “Application of the Tangential Radiographic Technique for Evaluating Pipe System Erosion/Corrosion”, Materials Evaluation/47/Oct. 1989, The American Society for Nondestructive Testing, Inc., pp. 1184-1188.
Burkle et al., “Burnoff and Film Latitude in the Tangential Radiographic Technique”, Materials Evaluation/Nov. 1992, The American Society for Nondestructive Testing, Inc., pp. 1274-1277.
Viswanathan et al., “Performance Characteristics of Conventional X-Ray Generator, Isotope Source, and High-Energy Accelerator in Rocket Motor Evaluation”, Materials Evaluation, Jan./Feb. 1987, American Society for Nondestructive Testing, Inc., pp. 86-90.
“Standard Guide for Radioscopy”, ASTM International Designation: E1000-98 (Reapproved 2009), pp. 1-31, (2009).
Leemans et al., “GeV electron beams from a centimetre-scale accelerator”, nature physics, vol. 2, Oct. 2006, pp. 696-699.
U.S. Appl. No. 12/259,753, filed Oct. 28, 2008, Gordon, III et al.
U.S. Appl. No. 12/145,214, filed Jun. 24, 2008, Parazzoli et al.
GB Search and Examination Report for application GB1012901.3 dated Oct. 12, 2010.
Adamski John L.
Bossi Richard H.
Gordon, III Clarence Lavere
Kao Glen
The Boeing Company
Yee & Associates P.C.
LandOfFree
Tangent radiography using brilliant x-ray source does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Tangent radiography using brilliant x-ray source, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Tangent radiography using brilliant x-ray source will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4288178