TAM with scan frame copy register coupled with serial output

Details TAM with scan frame copy register coupled with serial output TAM with scan frame copy register coupled with serial output

2011-07-19

2011-07-19

Guyton, Philip (Department: 2113)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S030000, C324S765010

Reexamination Certificate

active

07984331

ABSTRACT:
Testing of an electrical device is achieved by providing a test access mechanism within the device that can receive scan frames from an external tester. The received scan frames contain stimulus data to be applied to circuitry within the device to be tested, a command for enabling a test control operation, and a frame marker bit to indicate the end of the scan frame pattern. The inputting of scan frames can occur continuously and simultaneous with a commanded test control operation.

REFERENCES:
patent: 6701476 (2004-03-01), Pouya et al.
patent: 7296200 (2007-11-01), Park et al.
patent: 7506231 (2009-03-01), Chang et al.
patent: 7620866 (2009-11-01), Marinissen et al.
patent: 2008/0265906 (2008-10-01), Waayers
patent: 2009/0193303 (2009-07-01), Giles et al.
DaSilva et al. “Overview of the IEEE P1500 Standard.” Proc 2003 International Test Conference. Sep. 28-Oct. 3, 2003.

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