Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-06-22
2009-02-03
Levin, Naum B (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C703S019000, C702S182000
Reexamination Certificate
active
07487475
ABSTRACT:
A method and an apparatus to perform statistical static timing analysis have been disclosed. In one embodiment, the method includes performing statistical analysis on performance data of a circuit from a plurality of libraries at two or more process corners using a static timing analysis module, and estimating performance of the circuit at a predetermined confidence level based on results of the statistical analysis during an automated design flow of the circuit without using libraries at the predetermined confidence level.
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Huang Shiang-Tang
Kriplani Harish
Alford William
Alford Law Group, Inc.
Cadence Design Systems Inc.
Levin Naum B
Wong Teresa
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