Systems for built-in-self-test for content addressable...

Details Systems for built-in-self-test for content addressable... Systems for built-in-self-test for content addressable...

2006-10-31

2006-10-31

Elms, Richard (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S049130, C714S718000, C714S733000

Reexamination Certificate

active

07130230

ABSTRACT:
An improved Built-In-Self-Test (BIST) architecture for Content Addressable Memory (CAM) devices, including a bit scanner for reading out the contents of the matchlines of the CAM cells as a serial bit stream; a bit transition detector that detects and determines the address of each bit transition in the serial bit stream; a state machine that generates bit addresses for each expected transition in the serial bit stream; and an analyser that compares expected transition bit addresses with detected transition addresses and declares a BIST failure if expected and detected transition addresses do not match at any point in the bit stream.

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