Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-05-06
2008-05-06
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C703S014000, C703S015000, C703S016000
Reexamination Certificate
active
10984245
ABSTRACT:
Systems and methods for simulating signal coupling in electronic devices are disclosed. In an exemplary implementation a computer program product executes a computer process to simulate a victim signal having a toggling bit pattern relative to a quiet culprit signal. The process also simulates a culprit signal having a toggling bit pattern relative to a quiet victim signal. The computer process generates test results for each simulation and combines the test results to determine effects of signal coupling in an electronic device.
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Burnside Clark D.
Parker Clinton H.
Zhou Dacheng
Chiang Jack
Hewlett--Packard Development Company, L.P.
Rossoshek Helen
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