Systems and methods for probing processor signals

Details Systems and methods for probing processor signals Systems and methods for probing processor signals

2006-08-15

2006-08-15

Hollington, Jermele (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07091732

ABSTRACT:
Signal probing systems are provided. One such signal probing system includes: a socket configured to be electrically coupled to a processor, a printed circuit board (PCB), a separation layer that is located between the socket and the PCB, compensation circuits that each include a resistor and a capacitor coupled in parallel, and an adapter that is attached to the PCB and that is configured to be electrically coupled to a motherboard, wherein the PCB is configured to route respective probed signals through the compensation circuits, the respective probed signals being responsive to respective signals traveling between the processor and the motherboard. Methods and other systems are disclosed.

REFERENCES:
patent: 6593763 (2003-07-01), Weber
patent: 6887109 (2005-05-01), Hofmeister et al.
patent: 2002/0011863 (2002-01-01), Takahashi et al.
patent: 2003/0122566 (2003-07-01), Takahashi et al.

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