Systems and methods for monitoring and controlling binary...

Electrical computers and digital processing systems: memory – Storage accessing and control – Shared memory area

Reexamination Certificate

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C711S147000, C711S131000, C711S154000

Reexamination Certificate

active

07747828

ABSTRACT:
A static random access memory (SRAM) includes an input read register (IRR) for monitoring the state of external binary devices and an output drive register (ODR) for controlling the state of external binary devices. The SRAM can be a multi-port device for access by multiple processors or controllers. Each bit of the IRR can mirror the state of a connected external binary device, and can be read to a connected processor using a standard read instruction. Each bit of the ODR can manipulate the state of a connected external binary device by providing the device with a path to the SRAM supply voltage. Each bit of the ODR can also be read without changing the state, or interrupting the operation of, the connected external binary device. When set to the proper mode, the addresses used for the IRR and ODR can be used with the SRAM main memory array for standard memory operations.

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International Search Report and Written Opinion received in PCT Application No. PCT/US05/37238, mailed Apr. 4, 2006.
International Preliminary Report on Patentability (IPRP) dated May 31, 2007, in corresponding PCT Application No. PCT/US2005/037238.

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